Measuring technique

Details Measuring technique Measuring technique

2006-09-12

2006-09-12

Porta, David (Department: 2884)

Radiant energy

Invisible radiant energy responsive electric signalling

Infrared responsive

Reexamination Certificate

active

07105823

ABSTRACT:
The present invention relates to apparatuses for use in performing a quantitative analysis of a turbid pharmaceutical sample, e.g. a tablet, a capsule or a similar sample forming a pharmaceutical dose. A pharmaceutical, turbid sample (24, 57, 67) is irradiated with an excitation beam (20, 53, 64) of radiation, e.g. near infrared radiation. The intensity of emitted radiation (30) from the sample (24, 57, 67) is detected as function of both the wavelength of the emitted radiation and the photon propagation time through said sample (24, 57, 67). Optionally, the intensity of the emitted radiation (30) from the sample (24, 57, 67) is also detected in a spatially resolved manner.

REFERENCES:
patent: 5012101 (1991-04-01), Goodall et al.
patent: 5037200 (1991-08-01), Kodama
patent: 5173749 (1992-12-01), Tell et al.
patent: 5943122 (1999-08-01), Holmes
patent: 6040914 (2000-03-01), Bortz et al.
patent: 6794670 (2004-09-01), Folestad et al.
patent: 2001/0035957 (2001-11-01), Clermont et al.
patent: WO 94/21173 (1994-09-01), None
patent: WO 99/49312 (1999-09-01), None
patent: WO 01/22063 (2001-03-01), None
Wei Wang, et al., “Femtosecond Multicolor Pump-Probe Spectroscopy of Ferrous Cytochrome c†,” J. Phys. Chem B., vol. 104, pp. 10789-10081 (Jun. 7, 2000).
Tsuyoshi Asahi, et al., “Development of a femtosecond diffuse reflectance spectroscopic system, evaluation of its temporal resolution, and applications powder systems,” Review of Scientific Instruments, vol. 69, No. 2, pp. 361-371 (Feb. 1998).
Paul Buck, et al., “Femtosecond continuum probe measurements of nonlinearities of organic dyes,” SPIE, vol. 2853, pp. 12-19 (1996).
Gerd Scheitzer, et al., “Femtosecond Transient Absorption Spectoscopy Using Multichannel Detection and Tunable UV Pump Light,” Soc. Opt. & Quant.Electron; Proc. Int. Conf. on Lasers '98, Tucson, Arizona, pp. 129-136 (Dec. 7-11, 1998).

Affiliated with

Also associated with

Rating

Measuring technique does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Measuring technique, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Measuring technique will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3600294