Measuring system for alignment and measurement with an electroni

Details Measuring system for alignment and measurement with an electroni Measuring system for alignment and measurement with an electroni

1981-05-28

1984-04-10

Wise, Edward J.

Boots, shoes, and leggings

356 5, G01C 308, G01B 1126

Patent

active

044424973

ABSTRACT:
A system for alignment and measurement of positions includes an electronic tachymeter and a reflector system. A processing system calculates the difference, in given coordinates, between the position of the reflector system and a position of known coordinates, and this data is transmitted to the reflector system. The reflector system includes a display for displaying this difference, enabling an operator at the reflector system to adjust the position of a reflector system tube to the known position.

REFERENCES:
patent: 3742473 (1973-06-01), Hadden
patent: 4113381 (1978-09-01), Epstein
patent: 4119948 (1978-10-01), Ward et al.
patent: 4171907 (1979-10-01), Hill et al.
patent: 4205385 (1980-05-01), Erickson et al.
patent: 4321683 (1982-03-01), Goring et al.
patent: 4346989 (1982-08-01), Gort et al.

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