Measuring system and a method for measuring particle...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Chemical analysis

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C073S061750, C073S865500, C175S066000, C356S028000, C356S336000, C427S180000, C427S142000, C702S142000, C702S190000, C324S452000, C324S457000

Reexamination Certificate

active

06862536

ABSTRACT:
Measuring systems and methods measure particle velocity and/or particle velocity distribution and/or particle size or particle size distribution. The measuring system includes a filter for filtering collected signals which is arranged to pass signals at a relevant frequency band or at relevant frequency bands. The relevant frequency band or frequency bands are arranged to correspond to a frequency band or frequency bands defined by frequencies which exist in consequence of one or more process equipment or a process occurrence affecting to the medium flow.

REFERENCES:
patent: 3719090 (1973-03-01), Hathaway
patent: 4010366 (1977-03-01), Neukermans et al.
patent: 4401695 (1983-08-01), Sopko
patent: 4434861 (1984-03-01), Howeth
patent: 4531402 (1985-07-01), Reif et al.
patent: 5059909 (1991-10-01), O'Brien
patent: 5214386 (1993-05-01), Singer et al.
patent: 5271280 (1993-12-01), Nissen
patent: 5296910 (1994-03-01), Cole
patent: 5502658 (1996-03-01), Relin
patent: 5561515 (1996-10-01), Hairston et al.
patent: 5831150 (1998-11-01), Sowerby et al.
patent: 6031378 (2000-02-01), Rosin
patent: 20010035954 (2001-11-01), Rahn et al.
patent: 1 485 750 (1977-09-01), None
patent: 2 063 482 (1981-06-01), None
patent: WO 9826255 (1998-06-01), None
Provisional application No. 60/188,278, filed on March 10, 2000.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Measuring system and a method for measuring particle... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Measuring system and a method for measuring particle..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Measuring system and a method for measuring particle... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3450240

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.