Optics: measuring and testing – Of light reflection
Reexamination Certificate
2006-06-20
2006-06-20
Toatley, Jr., Gregory J. (Department: 2877)
Optics: measuring and testing
Of light reflection
C356S246000
Reexamination Certificate
active
07064837
ABSTRACT:
Disclosed herein is a sensor utilizing attenuated total reflection. The sensor is constructed of a measuring chip, an optical system, and a measuring section. The measuring chip is equipped with a dielectric block, a thin film layer formed on the dielectric block, and a liquid-sample holding portion for holding a liquid sample. The optical system is used to make a light beam enter the dielectric block at various angles of incidence so that a total internal reflection condition is satisfied at an interface between the dielectric block and the thin film layer. The measuring section measures the state of attenuated total reflection, based on the intensity of the light beam totally reflected at the interface. The liquid-sample holding portion has an opening at its top surface. The sensor further has a lid supply mechanism for placing a lid on the opening to prevent evaporation of the liquid sample.
REFERENCES:
patent: 4810658 (1989-03-01), Shanks et al.
patent: 5443791 (1995-08-01), Cathcart et al.
patent: 6143250 (2000-11-01), Tajima
patent: 6271040 (2001-08-01), Buechler
patent: 04-292126 (1992-10-01), None
patent: 04-353747 (1992-12-01), None
patent: 6-167443 (1994-06-01), None
patent: 08-327532 (1996-12-01), None
patent: 10-300667 (1998-11-01), None
patent: 11-064213 (1999-03-01), None
patent: 2000-65729 (2000-03-01), None
patent: 2000-352554 (2000-12-01), None
patent: 1 079 226 (2001-02-01), None
patent: 2001-061464 (2001-03-01), None
patent: WO 95/22754 (1995-08-01), None
Takayuki Okamoto; “Surface Refracto-Sensor using Evanescent Waves” Spectrum Researches; vol. 47, No. 1, 1998, pp. 21-23, 26-27.
Hayashi Katsumi
Kunuki Yoshiyuki
Mori Nobufumi
Naya Masayuki
Ogura Nobuhiko
Fuji Photo Film Co. , Ltd.
Merlino Amanda
Sughrue & Mion, PLLC
LandOfFree
Measuring sensor utilizing attenuated total reflection and... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Measuring sensor utilizing attenuated total reflection and..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Measuring sensor utilizing attenuated total reflection and... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3675257