Optics: measuring and testing – By dispersed light spectroscopy – With sample excitation
Patent
1994-12-15
1996-10-29
Evans, F. L.
Optics: measuring and testing
By dispersed light spectroscopy
With sample excitation
356316, 356417, G01N 2169
Patent
active
055701795
ABSTRACT:
The invention relates to a measuring sensor for the spectroscopic analysis of gas mixtures by means of a silent electrical discharge. A measuring sensor (1) includes a chamber (4), provided with a wall (16) made of a dielectric material, flow connections (5, 6) in this wall for carrying therethrough a gas mixture to be analyzed into (G.sub.1) and out of (G.sub.2) the chamber at a pressure (P) equal to that of ambient air, electrodes (2, 3) on the opposite sides of the chamber with a high alternating voltage (U) applied therebetween, and at least one window (8) in this wall, which is transmissive to wavelengths to be measured. In addition, the sensor includes a light detector element (12) for measuring the intensity of a radiation coming through the window. Said high alternating voltage (U) has a frequency which is at least in the order of 10 kHz for generating in a gas mixture (G) a radiation emission based on the non-ionizing excitation of molecules and/or atoms. The measuring arrangement of the invention includes a measuring sensor operating on some other measuring principle, which produces a signal for analyzing at least one other gas component included in the gas mixture by using a computing unit. The measuring values can be output separately or used for checking the analyzing results received from various measuring sensors and, if necessary, for effecting corrections to the results.
REFERENCES:
patent: 2943223 (1960-06-01), Fay
patent: 3032654 (1962-05-01), Fay et al.
patent: 3336493 (1967-08-01), Lambert
patent: 4233513 (1980-11-01), Elder et al.
patent: 4633705 (1987-01-01), Merilainen et al.
patent: 4898465 (1990-02-01), Crawford et al.
patent: 5070245 (1991-12-01), Rantala et al.
patent: 5118989 (1992-06-01), Egermeier et al.
patent: 5412467 (1995-05-01), Makczewski et al.
Emission Spectrometric Method and Analyzer for Traces of Nitrogen in Argon, Homer Ray, Paul H. Mohr, and Gerhard A. Cook, Analytical Chemistry, vol. 34, No. 10, Sep. 1962, pp. 1254-1260.
Evans F. L.
Instrumentarium Oy
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