Measuring process and arrangement for the three-dimensional posi

Details Measuring process and arrangement for the three-dimensional posi Measuring process and arrangement for the three-dimensional posi

1991-04-24

1992-11-24

Nelms, David C.

Radiant energy

Photocells; circuits and apparatus

Photocell controls its own optical systems

2502062, 21912178, G01J 120

Patent

active

051665050

ABSTRACT:
A process and apparatus for three-dimensional position control of the focal point of a high-energy laser beam by measuring its directional and focal point deviation. A portion of the energy of the laser beam is split off by means of a beam splitter extending over the whole cross-section of the laser beam and is focussed on a quadrant detector by means of an optical system which introduces an astigmatic aberration. The various patterns and pattern positions generated on the quadrant detector as a function of the defocussing and directional deviation are analyzed by means of an electronic system, and corresponding control signals are generated.

REFERENCES:
patent: 3296594 (1967-01-01), Van Heerden
patent: 4731772 (1988-03-01), Lee
patent: 4742219 (1988-05-01), Ando
patent: 4845352 (1989-07-01), Benschop
patent: 4929823 (1990-05-01), Kato et al.
Sensor Review, 10(1) pp. 35-37-Industrial application for optical profilometry, Jan. 1990.
Optical Readout of Viedodisc.-IEEE transactions on consumer electronics, Nov. 1976.

Affiliated with

Also associated with

Rating

Measuring process and arrangement for the three-dimensional posi does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Measuring process and arrangement for the three-dimensional posi, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Measuring process and arrangement for the three-dimensional posi will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-923774