Measuring probe for measuring high frequencies

Details Measuring probe for measuring high frequencies Measuring probe for measuring high frequencies

2006-05-09

2006-05-09

Nguyen, Vinh (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

Reexamination Certificate

active

07042236

ABSTRACT:
The invention relates to a measuring probe (100) for measuring high frequencies, comprising a contact end (20) for contacting planar structures and a coaxial-cable end (18) for connecting to a coaxial cable (22), whereby a coplanar conductor structure (10) consisting of at least two conductors (12, 14) is located between the contact end (20) and the coaxial-cable end (18). A dielectric (28) which supports the coplanar conductor structure (10) is provided on at least one side, in particular both sides of the coplanar conductor structure (10) which extends over a predetermined section between the coaxial-cable end (18) and the contact end (20). Between the dielectric (28) and the contact end (20), the measuring probe (100) is configured in such a way, that the conductors (12, 14) of the coplanar conductor structure (10) are held freely in space and are mounted in an elastic manner in relation to the supporting dielectric (28).

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patent: 6181150 (2001-01-01), Okuno

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