Optics: measuring and testing – By light interference – Having light beams of different frequencies
Reexamination Certificate
2005-06-21
2005-06-21
Toatley, Jr., Gregory J. (Department: 2877)
Optics: measuring and testing
By light interference
Having light beams of different frequencies
C398S204000
Reexamination Certificate
active
06909508
ABSTRACT:
Apparatus and methods of measuring optical waveforms are described. In one aspect, an optical waveform measurement apparatus includes a light wave source, a mixer, a down converter, and a controller. The light wave source is operable to provide an adjustable frequency light wave with a frequency that is adjustable over a target frequency range. The mixer is operable to mix a target modulated optical signal with the adjustable frequency light wave to obtain a mixed signal. The frequency down converter is operable to down convert the mixed signal to obtain a down-converted signal. The controller is operable to extract from the down-converted signal amplitude and phase information relating to the target modulated optical signal and to cause the light wave source to incrementally adjust the frequency of the adjustable frequency light wave over the target frequency range.
REFERENCES:
patent: 6456380 (2002-09-01), Naganuma
patent: 6483287 (2002-11-01), Otsubo et al.
patent: 2002/0024689 (2002-02-01), Shirane et al.
patent: 2002/0175275 (2002-11-01), Yamada et al.
patent: 2003/0016347 (2003-01-01), Ohta
Agilent Technologie,s Inc.
Lyons Michael A.
Toatley , Jr. Gregory J.
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