Measuring noise figure and y-factor

Details Measuring noise figure and y-factor Measuring noise figure and y-factor

1992-07-21

1993-03-02

Harvey, Jack B.

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Parameter related to the reproduction or fidelity of a...

324638, G01R 2706

Patent

active

051912945

ABSTRACT:
Apparatus for measuring the noise parameters of a device under test (DUT), with full compensation for impedance mismatches between the DUT and the test apparatus. The apparatus includes an S-parameter measuring device, such as vector network analyzer (VNA), combined with a noise module. The noise module includes, among other things, a pair of test ports for the DUT, a noise source which can be turned on or off by an external controller, a receiver, and a switch for coupling the output of the DUT to selectably either the receiver or port 2 of the VNA.

REFERENCES:
patent: 4858160 (1989-08-01), Strid et al.
patent: 4905308 (1990-02-01), Davidson
patent: 4998071 (1991-03-01), Strid et al.
Cascade Microtech, "On-Wafer Noise and S-Parameter Measurement", Model NPT18 Noise Test Set, Sales Brochure Nov. 1988.
Leake et al., Use Network Data to Hone On-Wafer Noise Parameters, Microwaves & RF Feb. 1989, pp. 99-105.
Automatic Testing and Networking, Inc., On-Wafer Noise Parameter and S-Parameter Measurement System, Microwave T. Sep. 1988.
Automatic Testing & Networking Inc., NP4 Series Noise Parameter Test Set 0.05-26.5 GHZ, (sales brochure) Jun. 1988.
Automatic Testing & Networking, Inc., NP5 Series On-Wafer Noise Parameter & S-Parameter Test Set, 2-18 GHZ (sales brochure Jun. 1988).

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