Measuring microscope

Optics: measuring and testing – By polarized light examination – With light attenuation

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356384, G01B 1100

Patent

active

044924704

ABSTRACT:
In a measuring microscope for measuring the distance between line elements of an optical image, means are provided for forming from an image-carrying beam, carrying the optical image, further image beams in which light of respective complementary regions of the image-carrying beam is suppressed, to form respective distinct non-overlapping but adjacent image portions for viewing. Means are provided for then carrying out calibrated displacement of the adjacent image portions. Thus, a line element in one image portion can be brought into alignment with a line element of an adjacent image portion. The degree of calibrated adjustment required for this gives a measure of the distance between the two line elements on the object which is imaged.
The microscope may be constituted so that means involved in the suppression of complementary regions of the image-carrying beam are readily removable so that overlapping images can be provided for viewing.

REFERENCES:
patent: 587443 (1897-08-01), Konig
patent: 1649106 (1927-11-01), Eppenstein
patent: 2730008 (1956-01-01), McGinn
patent: 3031916 (1962-05-01), Burns
patent: 3326079 (1967-06-01), Dyson et al.
patent: 4088410 (1978-05-01), Smith

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