Electricity: measuring and testing – Particle precession resonance – Spectrometer components
Reexamination Certificate
2007-01-23
2007-01-23
Shrivastav, Brij B. (Department: 2859)
Electricity: measuring and testing
Particle precession resonance
Spectrometer components
C324S309000
Reexamination Certificate
active
11213585
ABSTRACT:
The present invention describes a magnetic resonance imaging method wherein spatially resolved frequency sensitive image data are collected by means of free precession sequences employing very small radio frequency (RF) excitation pulses per unit time which result in highly frequency selective steady-state signals dominated by linear properties of the system, for which the superposition principle holds. By appropriate linear combination of steady state signals of N different frequencies, N resonance lines can be acquired simultaneously. This method allows spectroscopic recordings with very low RF power deposition which renders the method suitable for applications at high static magnetic field strengths.
REFERENCES:
patent: 4707658 (1987-11-01), Frahm et al.
patent: 4769603 (1988-09-01), Oppelt et al.
patent: 6291996 (2001-09-01), Glover et al.
T.R. Brown et al. “NMR chemical shift imaging in three dimensions”, Proc. Natl. Acad. Sci. USA, vol. 79, 3523-3526 (1982).
H.Y. Carr “Steady-state free precession in nuclear magnetic resonance”, Physical Review, vol. 112, 1693-1701 (1958).
O. Speck, et al. “Fast31P chemical shift imaging using SSFP methods”, Magn. Reson. Med., vol. 48, 633-639 (2002).
W. Dreher, et al. “Fast proton spectroscopic imaging using steady-state free precession methods”, Magn. Reson. Med., vol. 50, 453-460 (2003).
R. Freeman et al. “Phase amd intensity abnormalities in Fourier transform NMR” J. Magn. Res., vol. 4, 366-383 (1971).
Barmet Christoph
Boesiger Peter
Eberhardt Kai
Kozerke Sebastian
Schär Michael
Cohen & Pontani, Lieberman & Pavane
Eidgenossiche Technische Hochschule (E T H)
Shrivastav Brij B.
Universitat Zurich
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