Measuring method, measuring system and storage medium

Television – Special applications – Manufacturing

Reexamination Certificate

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C348S095000

Reexamination Certificate

active

07420588

ABSTRACT:
There are provided a measuring method and a measuring system which enable creation of a measurement route with ease to thereby enable three-dimensional measurement to be quickly performed even if an object to be measured has a complicated shape or configuration. An object to be measured is shot. A plurality of images obtained by the shooting are combined together to generate a combined image of the object. A measuring region of the generated combined image is designated. A measurement path measuring program is created by inputting parameters for creating a measurement path. The designated measuring region is measured along the measurement path according to the created measurement path measuring program.

REFERENCES:
patent: 4920273 (1990-04-01), Sacks et al.
patent: 5255199 (1993-10-01), Barkman et al.
patent: 5956253 (1999-09-01), Gottschalk
patent: 6064759 (2000-05-01), Buckley et al.
patent: 6084663 (2000-07-01), Seng
patent: 6269179 (2001-07-01), Vachtsevanos et al.
patent: 6414711 (2002-07-01), Arimatsu et al.
patent: 08-014876 (1996-01-01), None
patent: 08-313217 (1996-11-01), None
patent: 10-078317 (1998-03-01), None
patent: 10-090284 (1998-04-01), None
patent: 11-351858 (1999-12-01), None
Fang et al., “Stereo Vision and CMM Integrated Intelligent Inspection System in Reverse Engineering”, Proceedings of the SPIE—The International Society for Optical Engineering, vol. 3521, Nov. 4, 1998, pp. 115-122.
Chan et al., “Neural Network Stereo Image Segmentation for Directed Coordinate Measuring Machine Part Programming”, IEEE Pacific Rim Conference on Communications, Computers and Signal Processing, Aug. 20, 1997, pp. 547-550.
Wang et al., “A vision-aided alignment datum system for coordinate measuring machines”, Measurement Science and Technology, vol. 8, No. 7, Jul. 1, 1997, pp. 707-714.
Oltzscher et al., “Hochauflösende Bildmeβtechnik—High resolution imaging technology”, Technisches Messen TM, vol. 60, No. 5, May 1, 1993, pp. 204-210.
Wang et al., “The use of a machine vision system in a flexible manufacturing cell incorporating an automated coordinate measuring machine”, Proceedings of the Institution of Mechanical Engineers, Part B, vol. 207, No. B3, 1993, pp. 199-202.
Labs, “Laser sensors pay off in accuracy”, I & CS—Industrial and Process Control Magazine, vol. 64, No. 7, Jul. 1, 1991, pp. 51-53.

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