Measuring method for equivalent circuitry

Details Measuring method for equivalent circuitry Measuring method for equivalent circuitry

1998-12-21

2000-10-24

Metjahic, Safet

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Distributive type parameters

324637, 703 14, G01R 2728

Patent

active

061372935

ABSTRACT:
A measuring method for equivalent circuitry is disclosed herein to characterize the interconnects using time-domain reflectometry measurement. By combining the layer peeling algorithm for transmission lines and the matrix-pencil approach for discontinuities, the technique yields a simple equivalent circuit model which consists of distributed transmission lines and networks of lumped elements. With element values being independent of frequency, the model is well suited to model nonlinear broadband circuit simulation for electrical performance of the interconnects.

REFERENCES:
patent: 4962359 (1990-10-01), Dunsmore
patent: 5003253 (1991-03-01), Majidi-Ahy et al.
patent: 5231349 (1993-07-01), Majidi-Ahy et al.
patent: 5371468 (1994-12-01), Pelster

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