Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
1998-03-20
2001-11-20
Metjahic, Safet (Department: 2858)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S525000
Reexamination Certificate
active
06320399
ABSTRACT:
The present invention concerns a chip integrated circuit measuring method and, more particularly, a measuring method for detecting a short-circuit between two turns of a coil integrated on a chip, and an integrated circuit structure adapted to such a measuring method.
BACKGROUND OF THE INVENTION
Coils are currently used in integrated circuit structures. By way of example, WO 88/00785 discloses a transponder device
1
formed in a substrate
2
and essentially comprising a coil
5
formed of several turns
6
. By way of illustration, this structure further includes various integrated circuits
3
,
4
.
A problem encountered in such structures lies in the fact that short-circuits may occur between two turns of such a coil during a subsequent step in the course of manufacture of the integrated structures. This may disturb, in particular, the operation of the coil, and may be particularly inconvenient in the event that the number of coil turns or the inductance of the coil are important parameters for certain applications, such as the use of the coil as a transponder antenna.
SUMMARY OF THE INVENTION
An object of the present invention is to provide a measuring method for detecting a short-circuit between two turns of a coil integrated on a chip, to avoid disturbances in the operation of said coil.
Another object of the present invention is to provide a measuring method which answers conventional industrial criteria, of cost, simplicity and speed of implementation.
These objects, in addition to others, are achieved thanks to a method for measuring a chip integrated structure including at least one coil comprising a plurality of turns, said method being characterised in that it comprises the following steps: measuring the resistance across the terminals of first and second portions of said coil, corresponding to two different numbers of turns of the coil; computing the ratio of the measured resistances across the terminals of first and second portions of said coil; comparing said ratio to a constant measured from a sample of resistance measurements made on coils of identical geometry; and determining the presence or the absence of a short circuit between at least two turns of one of said portions of said coil, when the ratio is different from or equal to said constant respectively.
An advantage of the present invention is to provide a measuring method which does not require use of specific equipment, which makes this method inexpensive.
Another advantage of the present invention is to provide a method essentially based on two resistance measurements, which makes this method simple and quick.
Another advantage of the present invention is to provide a method which does not depend upon variable technological or environmental type parameters, which makes this measuring method particularly reliable and accurate.
Another object of the present invention is to provide an integrated circuit structure adapted to the measuring method according to the present invention.
Another object of the present invention is to provide an integrated circuit structure of this type which answers conventional industrial criteria of cost, simplicity and speed of implementation.
These objects, in addition to others, are achieved by an integrated circuit structure including at least one coil comprising a plurality of turns, said structure being characterised in that said coil further comprises contact pads integral to said turns, and able to allow implementation of the above defined measuring method.
An advantage of the present invention is to provide an integrated circuit structure of the same complexity as conventional structures, which does not require additional manufacturing steps.
REFERENCES:
patent: 4175253 (1979-11-01), Piteoff
patent: 4176313 (1979-11-01), Wrinn
patent: 4835466 (1989-05-01), Maly et al.
patent: 5307019 (1994-04-01), Robey et al.
patent: 5670891 (1997-09-01), Ling et al.
patent: 11 78 938 B (1964-10-01), None
patent: 0 655 628 A2 (1995-05-01), None
patent: 0 867 726 A1 (1998-09-01), None
patent: 10-274668 (1997-07-01), None
patent: WO 88/00785 (1988-01-01), None
Technical Digest—Western Electric, No. 36 Oct. 1974, New York US, pp. 23-24, XP002039215 Mila: “Testing Twisted Pairs For Opens, Short . . . ”.
Banyai Antal
Kunz Pascal
EM Microelectronic-Marin SA
Griffin & Szipl, P.C.
Metjahic Safet
Nguyen Vincent Q.
LandOfFree
Measuring method for detecting a short-circuit between the... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Measuring method for detecting a short-circuit between the..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Measuring method for detecting a short-circuit between the... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2576192