Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate
2005-03-18
2010-12-28
Bhatnagar, Anand (Department: 2624)
Image analysis
Applications
Manufacturing or product inspection
C348S092000, C700S109000
Reexamination Certificate
active
07860295
ABSTRACT:
A method and a unit for determining the spatial position of a wheel rim with respect to a measuring unit having at least one camera, wherein the wheel rim lies in the viewing field of the camera, including making available of a model, that describes a model body of a localizable wheel rim geometry detail as well as the spatial position of the model body with respect to the measuring unit, through model parameters, capturing of a picture of the wheel rim geometry detail of the wheel rim with the camera, fitting the image of the model body resulting from the model parameters to the picture of the wheel rim geometry detail through changing the model parameters of the model, and tracking the changes of the model parameters upon the fitting, whereby the data related to the position of the model body of the wheel rim geometry detail reflect the spatial position of the wheel rim-geometry detail and, thereby, the wheel rim itself, when the image resulting from the model parameters, of the wheel rim-geometry detail fits to the captured picture of the wheel rim geometry detail within the asserted tolerance limits. The invention also relates to a wheel alignment measuring method and to a wheel alignment measuring system that uses said method and said unit.
REFERENCES:
patent: 5206720 (1993-04-01), Clothiaux et al.
patent: 5619587 (1997-04-01), Willoughby et al.
patent: 5731870 (1998-03-01), Bartko et al.
patent: 6323776 (2001-11-01), Jackson et al.
patent: 2008/0267441 (2008-10-01), Bux et al.
patent: 29 48 573 (1981-06-01), None
patent: 197 57 760 (1999-07-01), None
patent: 197 57 763 (1999-07-01), None
patent: 100 32 356 (2002-01-01), None
patent: 100 43 354.5 (2002-03-01), None
patent: 100 50 653 (2002-05-01), None
patent: 0 895 056 (1999-02-01), None
patent: 1 184640 (2002-03-01), None
patent: WO 01/77617 (2001-10-01), None
PCT Search Report for PCT/EP2005/002940, mailed Jun. 20, 2005, 3 pages.
Bux Hermann
Donner Karin
Engl Rudolf
Schommer Stefan
Beissbarth GmbH
Bhatnagar Anand
Blakely Sokoloff Taylor & Zafman LLP.
LandOfFree
Measuring method and measuring unit for determining the... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Measuring method and measuring unit for determining the..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Measuring method and measuring unit for determining the... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4212148