Measuring method and measuring device using quartz oscillator

Measuring and testing – Vibration – Resonance – frequency – or amplitude study

Reexamination Certificate

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Details

C073S580000, C177S2100FP, C310S312000, C422S068100, C435S287100, C436S501000

Reexamination Certificate

active

07874211

ABSTRACT:
An object of the present invention is that any of mass load, viscous load and viscoelasticity load is measured separately from other load whereby properties of the substance to be measured are able to be measured correctly.The characteristic feature of the present invention is that, in a method where property of a substance contacting to a quartz oscillator equipped with electrodes on both sides of a quartz plate is measured on the basis of the changes in frequency of the above quartz oscillator, the property of the above substance is measured using at least two frequencies among the n-th overtone mode frequency (n=1, 3, 5, . . . (n=2k+1)) of quartz oscillator when voltage is applied between the above electrodes and using frequencies F1, F2(F1<F2) giving one half of the maximum value of conductance near the resonant point by each frequency.

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patent: 5814525 (1998-09-01), Renschler et al.
patent: 5869763 (1999-02-01), Vig et al.
patent: 07-055860 (1995-03-01), None
patent: 2001-304945 (2001-10-01), None
patent: 2003-315235 (2003-11-01), None
patent: 2004-184256 (2004-07-01), None
patent: 2004-325257 (2004-11-01), None
patent: 2005-98866 (2005-04-01), None
patent: 2006-52996 (2006-02-01), None
patent: 2007-071722 (2007-03-01), None

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