Measuring method and measuring apparatus for determining the rel

Optics: measuring and testing – By particle light scattering – With photocell detection

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356356, G01B 902

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active

054042208

ABSTRACT:
A method and an apparatus for measuring a very small displacement of an object. The first and second beat signals are produced by light beams of different frequencies diffracted by a diffraction grating. The phase difference between the first and second beat signals is detected, thereby measuring the relative displacement of the diffraction grating.

REFERENCES:
patent: 34010 (1893-10-01), Magome et al.
patent: 4948251 (1990-08-01), Kondo
patent: 5000573 (1991-03-01), Suzuki et al.
patent: 5070250 (1991-12-01), Komatsu et al.
patent: 5104225 (1992-04-01), Masreliez
patent: 5126562 (1992-06-01), Ishizuka
patent: 5182610 (1993-01-01), Shibata
patent: 5214489 (1993-05-01), Mizutani et al.
patent: 5231467 (1993-07-01), Takeuchi et al.
patent: 5249032 (1993-09-01), Matsui et al.
IBM Technical Disclosure Bulletin, "Interferometric Method of Checking The Overlay Accuracy in Photolithographic Exposure Processes", vol. 32, No. 10B, Mar. 1990, pp. 214-217.
Patent Abstracts of Japan, vol. 15, No. 79, Feb. 25, 1991, English Abstract of Japanese Pat. No. 2-297005.

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