Measuring method and measuring apparatus

Details Measuring method and measuring apparatus Measuring method and measuring apparatus

1992-07-08

1994-06-14

Warden, Robert J.

Optics: measuring and testing

By particle light scattering

With photocell detection

356351, G01B 902

Patent

active

053215028

ABSTRACT:
A measuring arrangement includes forming first and second pairs of light beams each having a low frequency light beam and a high frequency light beam. Both pairs of light beams generate beat signals of the same frequency. The low frequency light beam of either pair and the high frequency of the other pair pass through a predetermined optical path to cause phase changes in the same direction. Beat signals are generated by superposing the first and second beam pair to provide measurement information on the phase changes.

REFERENCES:
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patent: 4486657 (1984-12-01), Bush
patent: 4575247 (1986-03-01), Tansey
patent: 4650330 (1987-03-01), Fujita
patent: 4842408 (1989-06-01), Yoshii et al.
patent: 4907886 (1990-03-01), Dandliker
patent: 4948251 (1990-08-01), Kondo
patent: 5025168 (1991-06-01), Aoki et al.
patent: 5076693 (1991-12-01), Teramoto
patent: 5177633 (1993-01-01), Wong

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