Measuring method and measuring apparatus

Details Measuring method and measuring apparatus Measuring method and measuring apparatus

1997-06-17

1999-08-17

Kim, Robert H.

Optics: measuring and testing

By dispersed light spectroscopy

Utilizing a spectrometer

356360, G01B 902

Patent

active

059401818

ABSTRACT:
A method of measuring a lens comprises an aligning step of relatively aligning a plurality of specified annular zones on a surface of the lens with predetermined positions, and a determining step of determining an aspherical axis of the target surface aligned in the aligning step.

REFERENCES:
patent: 5004346 (1991-04-01), Kiihel
patent: 5625454 (1997-04-01), Huang et al.

Affiliated with

Also associated with

Rating

Measuring method and measuring apparatus does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Measuring method and measuring apparatus, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Measuring method and measuring apparatus will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-320120