Optics: measuring and testing – Of light reflection
Reexamination Certificate
2007-03-06
2007-03-06
Stafira, Michael P. (Department: 2877)
Optics: measuring and testing
Of light reflection
Reexamination Certificate
active
10291566
ABSTRACT:
In a measuring method utilizing the phenomenon of attenuation in total internal reflection in which a light beam is caused to enter a dielectric block provided with a film layer to be brought into contact with a sample so that total internal reflection conditions are satisfied at the interface of the dielectric block and the film layer and various angles of incidence of the light beam to the interface of the dielectric block and the film layer can be obtained, and the intensity of the light beam reflected in total internal reflection at the interface is detected, the light beam is caused to intermittently impinge upon the dielectric block.
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Takayuki Okamoto, “Spectral Research” Surface Refracto-Sensor Using Evanescent Waves: Principles and Instrumentations, vol. 47, No. 1, Dec. 8, 1998.
Kimura Toshihito
Naya Masayuki
Sato Shu
Sawano Mitsuru
Shimizu Hitoshi
Fuji Photo Film Co. , Ltd.
Stafira Michael P.
Sughrue & Mion, PLLC
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