Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2008-12-12
2011-10-11
Barbee, Manuel L (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C702S124000, C324S605000
Reexamination Certificate
active
08036841
ABSTRACT:
A method and device are disclosed for measuring potentiometric measuring probes. An exemplary method includes feeding two test voltages comprising a harmonic wave Uegwith a base frequency fgand the harmonic wave Uerwith a base frequency frinto two cores of a connecting cable through voltage source impedances, respectively. The voltage between an indicating electrode and a reference electrode, and the AC responding signal resulting from the two test voltages are passed to an amplifier and further to a transfer function unit having transfer functions (Hg, Hr), an A/D converter, and a Fourier transformation unit, to calculate a potential Uxand the two test responses Ugand Ur, respectively. Two calibration responses Uehgand Uehrare determined, wherein Uehgincludes a product of Uegand Hg, and wherein Uehrincludes a product of Uerand Hr. Functional expressions are established for the test responses Ugand Ur, and the internal resistances Rgand Rrare determined by simultaneously solving equations having the unknown resistances Rgand Rrand capacitances C1and C2. Accurate measurement of the internal resistance of the electrode can be achieved even with a relatively long connecting cable.
REFERENCES:
patent: 4777444 (1988-10-01), Beijk et al.
patent: 4822456 (1989-04-01), Bryan
patent: 0 241 601 (1987-10-01), None
patent: 0 497 994 (1992-08-01), None
patent: WO 92/21962 (1992-12-01), None
patent: WO 00/14523 (2000-03-01), None
Form PCT/ISA/210 (International Search Report dated Nov. 30, 2007.
Comments on the Written Opinion of the International Searching Authority dated Jan. 25, 2008.
Barbee Manuel L
Buchanan & Ingersoll & Rooney PC
Mettler-Toledo AG
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