Photocopying – Projection printing and copying cameras – Distortion introducing or rectifying
Reexamination Certificate
2004-12-15
2009-02-24
Kim, Peter B (Department: 2851)
Photocopying
Projection printing and copying cameras
Distortion introducing or rectifying
C355S053000, C355S077000
Reexamination Certificate
active
07495742
ABSTRACT:
A method for measuring an optical performance of a projection optical system in an exposure apparatus that exposes a pattern on a reticle onto a substrate includes the steps of determining an pupil area in the projection optical system, scanning a test reticle or a reference plate, imaging a test pattern on the test reticle or the reference plate onto a surface of the substrate via the pupil area in the projection optical system which has been determined by the determining step, and measuring a positional offset between a predetermined position and an image of the test pattern that has been imaged by the imaging step.
REFERENCES:
patent: 5661548 (1997-08-01), Imai
patent: 5828455 (1998-10-01), Smith et al.
patent: 6633390 (2003-10-01), Shiode et al.
patent: 6960415 (2005-11-01), Shiode
patent: 7190443 (2007-03-01), Shiode
patent: 2002/0015158 (2002-02-01), Shiode et al.
patent: 2002/0159040 (2002-10-01), Hamatani et al.
patent: 2003/0091913 (2003-05-01), Shiode
patent: 2003/0133099 (2003-07-01), Shiode
patent: 2004/0109148 (2004-06-01), Shima
patent: 2001-264582 (2001-09-01), None
patent: 2002-289494 (2002-10-01), None
patent: 2003-178968 (2003-06-01), None
patent: 2003-318090 (2003-11-01), None
Canon Kabushiki Kaisha
Kim Peter B
Morgan & Finnegan , LLP
LandOfFree
Measuring method and apparatus, exposure method and... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Measuring method and apparatus, exposure method and..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Measuring method and apparatus, exposure method and... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4110306