Geometrical instruments – Gauge – Coordinate movable probe or machine
Patent
1999-06-22
2000-12-05
Gutierrez, Diego
Geometrical instruments
Gauge
Coordinate movable probe or machine
33556, 33559, G01B 5004, G01B 5008
Patent
active
06154972&
ABSTRACT:
A measuring machine includes a probe mounting portion, a probe mounted on the probe mounting portion, for contacting a measuring surface of a workpiece, and a detector for detecting an amount of displacement of the probe as the probe moves in contact with the measuring surface of the workpiece. A cleaning device is provided at the probe mounting portion, with a nozzle for ejecting gas upon the measuring surface of the workpiece when the probe is positioned close to the measuring surface. A rotative driving device is provided for rotatively driving the cleaning device about the probe.
REFERENCES:
patent: 5173613 (1992-12-01), Henry et al.
patent: 5189805 (1993-03-01), Matsumoto et al.
patent: 5189806 (1993-03-01), McMurtry et al.
patent: 5291662 (1994-03-01), Matsumiya et al.
patent: 5615489 (1997-04-01), Breyer et al.
Francis F.
Gutierrez Diego
Mitutoyo Corporation
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