Measuring ion number and detector gain

Radiant energy – Ionic separation or analysis – Methods

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C250S281000, C250S292000

Reexamination Certificate

active

07109474

ABSTRACT:
Method and apparatus, including computer program products, implement techniques for operating a mass spectrometer that includes a source of ions, a mass analyzer, and a detector, in which a gain of the detector or the number of ions detected by the detector is calculated based on intensity measurements for ions having a plurality of different m/z values. In particular implementations, the detector gain or the number of ions detected by the detector can be calculated based on a ratio of or difference between intensity values for at least two of the ions having different m/z values.

REFERENCES:
patent: 4746794 (1988-05-01), French et al.
patent: 5157260 (1992-10-01), Mylchreest et al.
patent: 5420925 (1995-05-01), Michaels
patent: 5463219 (1995-10-01), Buckley et al.
patent: 6265714 (2001-07-01), Shimomura
patent: 6674068 (2004-01-01), Kammei
Parminder Kaur et al., “Use Of Statistical Methods For Estimation Of Total Number Of Charges In A Mass Spectrometry Experiment”, Analytical Chemistry, 2004, pp. A-G.
Michael J. Kristo and Christie G. Ente, “System For Simultaneous Count/Current Measurement With A Dual-Mode Photon/Particle Detector”, Rev. Scientific Instruments vol. 59, No. 3, Mar. 1988, pp. 438-442.
William J. Fies, “A Method For Measuring The Gain Of An Electron Multiplier”, International Journal Of Mass Spectrometry and Ion Processes, vol. 82, Jul. 1987, pp. 111-127.
Keith Birkinshaw, “Special Feature: Tutorial, Fundamentals Of Focal Plane Detectors”, Journal of Mass Spectrometry, vol. 32, 1997, pp. 795-806.
G. Lakits et al., “Electron Emission From Metal Surfaces Bombarded By Slow Neutral And Ionized Particles”, Nuclear Instruments and Methods In Physics Research B48, 1990, pp. 597-603.
G. Laktis et al.., “Statistics Of Ion-Induced Electron Emission From A Clean Metal Surface”, Rev. Scientific Instruments, vol. 60, No. 10, Oct. 1989, pp. 3151-3159.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Measuring ion number and detector gain does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Measuring ion number and detector gain, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Measuring ion number and detector gain will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3569697

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.