Optics: measuring and testing – Dimension – Thickness
Reexamination Certificate
2006-04-10
2008-10-28
Nguyen, Sang (Department: 2886)
Optics: measuring and testing
Dimension
Thickness
C356S488000, C356S494000, C356S499000, C250S231140, C250S23700G
Reexamination Certificate
active
07443518
ABSTRACT:
A measuring instrument, in particular for transmission measurement with transparent substrates, comprises a measuring head with a light emitting element for emitting a light beam and a light receiver element for recording an incident light beam, and a retro-reflector for reflection of the emitted light beam. The measuring instrument allows transmission measurements to be carried out on transparent substrates with only one reflection measuring head. The measuring instrument also allows reflection measurements to be carried out, for example on non-transparent substrates or by tilting the measuring head and covering the retro-reflector. The measuring instrument only requires one measuring head and can therefore be produced more cost-effectively. It does not require calibration, as the retro-reflector also reflects the light in the original direction in the case of oblique incidence and in the event of positional changes caused by process or operational factors (vibrations etc.).
REFERENCES:
patent: 3775012 (1973-11-01), Ling et al.
patent: 4243882 (1981-01-01), Yasujima et al.
patent: 4629886 (1986-12-01), Akiyama et al.
patent: 4632548 (1986-12-01), Gunter et al.
patent: 4676645 (1987-06-01), Taniguchi et al.
patent: 4970388 (1990-11-01), Nishimura et al.
patent: 4975571 (1990-12-01), McMurtry et al.
patent: 4979826 (1990-12-01), Ishizuka et al.
patent: 5015096 (1991-05-01), Kowalski et al.
patent: 5035507 (1991-07-01), Nishioki et al.
patent: 5066130 (1991-11-01), Tsukiji et al.
patent: 5120132 (1992-06-01), Spies et al.
patent: 5187545 (1993-02-01), Allgauer
patent: 5220463 (1993-06-01), Edelstein et al.
patent: 5404220 (1995-04-01), Takeuchi et al.
patent: 5491551 (1996-02-01), Mattson
patent: 5541729 (1996-07-01), Takeuchi et al.
patent: 5991040 (1999-11-01), Doemens et al.
patent: 6392807 (2002-05-01), Barbarossa et al.
patent: 6577401 (2003-06-01), Matsumoto
patent: 6791698 (2004-09-01), Doemens et al.
patent: 28 24 583 (1979-12-01), None
patent: 44 18 180 (1996-01-01), None
patent: 195 06 312 (1996-08-01), None
Krause Jochen
Proehl Holger
Cardona, Esq. Victor A.
Heslin Rothenberg Farley & & Mesiti P.C.
Nguyen Sang
Von Ardenne Anlagentechnik GmbH
LandOfFree
Measuring instrument, in particular for transmission... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Measuring instrument, in particular for transmission..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Measuring instrument, in particular for transmission... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4009710