Measuring instrument for the optical focal spot

Details Measuring instrument for the optical focal spot Measuring instrument for the optical focal spot

1981-06-01

1984-04-10

Smith, Alfred E.

X-ray or gamma ray systems or devices

Accessory

Testing or calibration

378 99, H05G 126

Patent

active

044425392

ABSTRACT:
A pinhole camera forms an image of the optical focal spot of an x-ray tube on a radiation-electrical transducer comprising an intensifier foil and a matrix of photo-sensitive detectors. A processing circuit including an adjustable amplitude selector selects detector output signals for transmission to a video monitor. A calibrated measuring grid can be superimposed on the focal spot image on the monitor.

REFERENCES:
patent: 3013157 (1961-12-01), Norton, Jr.
patent: 3028544 (1962-04-01), Stone
patent: 3515870 (1970-06-01), Marquis
patent: 3928767 (1975-12-01), Roeck
patent: 4179100 (1979-12-01), Sashin et al.
Snow, "Self-Scanning Photodiode Arrays for Spectroscopy", Research Development, Apr. 1976, pp. 18-22.
Bernstein et al., "An X-ray Pinhole Camera with Nanosecond Resolution", The Review of Scientific Instruments, vol. 41, No. 12, Dec. 1970, pp. 1843-1845.
"Final Draft on Focal Spot Characteristics", International Electrotechnical Commission of 10/30/79, pp. 1-34.
Brochure, "RETICON Product Summary Solid State Image Sensors", Reticon Corporation, Mountain View, CA, 4 pp., 1972.

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