Data processing: measuring – calibrating – or testing – Measurement system – Orientation or position
Reexamination Certificate
2006-12-26
2006-12-26
Barlow, John (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system
Orientation or position
C702S158000, C702S161000, C702S162000
Reexamination Certificate
active
07155364
ABSTRACT:
A measuring instrument (1) has an arm (4) having a detector at a distal end thereof, and an arm guide (53) supporting the arm (4) in a manner movable in the axial direction thereof, the measuring instrument measuring a dimension of a workpiece based on the position of the detector. The arm (4) includes a main arm (41) and a sub-arm (42) that are sequentially arranged in the arm guide (53) and are supported in a manner movable relative to a former component thereof. The measuring instrument (1) has a synchronous driver (54) for moving the main arm (41) on the base side and the sub-arm (42) located next to the main arm (41) in the axial direction of the main arm (41).
REFERENCES:
patent: 887994 (1908-05-01), Bartram
patent: 3658429 (1972-04-01), Zipin
patent: 3940982 (1976-03-01), Hironaka
patent: 4432141 (1984-02-01), Marcyan
patent: 4702009 (1987-10-01), Dighton et al.
patent: 4989884 (1991-02-01), Goodman
patent: 5396712 (1995-03-01), Herzog
patent: 5615489 (1997-04-01), Breyer et al.
patent: 6272766 (2001-08-01), Tondorf et al.
patent: 24 13 335 (1975-09-01), None
patent: 35 14 309 (1986-10-01), None
patent: A 4-45911 (1992-02-01), None
patent: WO 02/101329 (2002-12-01), None
Barlow John
Cherry Stephen J.
Mitutoyo Corporation
Oliff & Berridg,e PLC
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