Measuring instrument

Details Measuring instrument Measuring instrument

2011-03-01

2011-03-01

Bennett, G. Bradley (Department: 2841)

Geometrical instruments

Gauge

Having a movable contact probe

Reexamination Certificate

active

07895764

ABSTRACT:
A measuring instrument includes: an XY stage on which an object to be measured is placed; a probe holder having a plurality of probes; and a relative moving mechanism that relatively moves the XY stage and the probe holder. The probe holder is provided with a probe selection mechanism that has two guide rails obliquely arranged and advances and retracts at least two of the probes to be selectively positioned at and away from a probe selection position.

REFERENCES:
patent: 3670421 (1972-06-01), Kiewicz et al.
patent: 4776103 (1988-10-01), Cote
patent: 4908951 (1990-03-01), Gurny
patent: 5028901 (1991-07-01), Enderle et al.
patent: 6065220 (2000-05-01), Ohtsuka et al.
patent: 6173504 (2001-01-01), Ohtsuka et al.
patent: 7024273 (2006-04-01), Tsuboi et al.
patent: 7386408 (2008-06-01), Nishibashi et al.
patent: 10 2007 019 453 (2008-10-01), None
patent: A-11-142141 (1999-05-01), None
patent: A-2007-271358 (2007-10-01), None
Sep. 29, 2009 Search Report issued in European Application No. 09 15 4315.7.

Affiliated with

Also associated with

Rating

Measuring instrument does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Measuring instrument, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Measuring instrument will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2657601