Optics: measuring and testing – Shape or surface configuration
Reexamination Certificate
2006-03-14
2006-03-14
Toatley, Jr., Gregory J. (Department: 2877)
Optics: measuring and testing
Shape or surface configuration
C356S602000
Reexamination Certificate
active
07012701
ABSTRACT:
In a method for characterizing a surface comprising a localized unevenness, a contour line of the surface is initially created as a function of a location variable. Subsequently, the localized unevenness is detected in the contour line and eliminated from the contour line, so that an incomplete contour line results as a function of the location variable, which characterizes the surface without the localized unevenness. The incomplete contour line may be used to either be able to evaluate the surface without any localized points of unevenness, for example to determine the side wobble or height wobble of a tire, if the surface is a side flank and/or a running tread of a vehicle tire, or to classify the localized points of unevenness without any influence of the surface.
REFERENCES:
patent: 6539789 (2003-04-01), Kostka et al.
patent: 38 27 696 (1988-08-01), None
patent: 198 49 793 (1998-10-01), None
Hassler Ulf
Kostka Günther
Schmitt Peter
Fraunhofer-Gesellschaft zur Forderung der Angewandten Forschung
Punnoose Roy M.
Thomas Kayden Horstemeyer & Risley
Toatley , Jr. Gregory J.
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