Measuring for device for contactless measurement of tires

Optics: measuring and testing – Shape or surface configuration

Reexamination Certificate

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Details

C356S602000

Reexamination Certificate

active

07012701

ABSTRACT:
In a method for characterizing a surface comprising a localized unevenness, a contour line of the surface is initially created as a function of a location variable. Subsequently, the localized unevenness is detected in the contour line and eliminated from the contour line, so that an incomplete contour line results as a function of the location variable, which characterizes the surface without the localized unevenness. The incomplete contour line may be used to either be able to evaluate the surface without any localized points of unevenness, for example to determine the side wobble or height wobble of a tire, if the surface is a side flank and/or a running tread of a vehicle tire, or to classify the localized points of unevenness without any influence of the surface.

REFERENCES:
patent: 6539789 (2003-04-01), Kostka et al.
patent: 38 27 696 (1988-08-01), None
patent: 198 49 793 (1998-10-01), None

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