Measuring equipment

Details Measuring equipment Measuring equipment

2005-11-01

2010-12-07

Chowdhury, Tarifur (Department: 2886)

Optics: measuring and testing

By dispersed light spectroscopy

Reexamination Certificate

active

07847931

ABSTRACT:
A measuring equipment utilizing terahertz pulse light, includes: a terahertz light generator that generates terahertz pulse light; a terahertz light detector that detects terahertz pulse light; a first condensing optical system that condenses the terahertz pulse light generated by the terahertz light generator; and a second condensing optical system that condenses the terahertz pulse light diverging after being condensed by the first condensing optical system, onto the terahertz light detector. A sample is arranged in a vicinity of a position of condensing the terahertz pulse light by the first condensing optical system; and at least one of the first and the second condensing optical systems includes at least one optical device having a positive or negative refractive power. The measuring equipment further includes: a position adjusting mechanism that adjusts a position of the at least one optical device on an optical axis when the terahertz light detector detects the terahertz pulse light having transmitted through the sample; and a controlling unit that controls the position adjusting mechanism.

REFERENCES:
patent: 6747736 (2004-06-01), Takahashi
patent: 2001/0029436 (2001-10-01), Fukasawa
patent: 2002/0005951 (2002-01-01), Fukasawa
patent: 2002/0067480 (2002-06-01), Takahashi
patent: 2004/0246493 (2004-12-01), Kim et al.
patent: 2005/0082479 (2005-04-01), Wallace et al.
patent: 1 469 298 (2004-10-01), None
patent: A 2001-50908 (2001-02-01), None
patent: A 2003-75251 (2003-03-01), None
patent: A 2004-212110 (2004-07-01), None
patent: WO 00/79248 (2000-12-01), None
patent: WO 03/023383 (2003-03-01), None
patent: WO 03/095991 (2003-11-01), None
Daniel F. Filipovic et al., “Double-Slot Antennas on Extended Hemispherical and Elliptical Silicon Dielectric Lenses,” IEEE Transactions on Microwave Theory and Techniques, vol. 41, No. 10, Oct. 1993, pp. 1738-1749, Section VII.
Supplementary European Search Report issued May 11, 2010 for European Application No. EP 05 80 5481.8.

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