Measuring device, test device, electronic device, program,...

Details Measuring device, test device, electronic device, program,... Measuring device, test device, electronic device, program,...

2011-06-28

2011-06-28

Dunn, Drew A (Department: 2857)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Electrical signal parameter measurement system

C702S066000, C702S071000, C702S082000, C324S12100R, C324S532000, C324S750010

Reexamination Certificate

active

07970565

ABSTRACT:
A measurement apparatus that measures a signal under measurement, including a strobe timing generator that sequentially generates strobes arranged at substantially even time intervals, a level comparing section that detects a signal level of the signal under measurement at a timing of each sequentially provided strobe, a capture memory that stores therein a data sequence of the signal levels sequentially detected by the level comparing section, a frequency domain converting section that converts the data sequence into a spectrum in the frequency domain, and a jitter calculating section that calculates jitter of the signal under measurement based on a value obtained by integrating levels of frequency components in a predetermined frequency range of the spectrum.

REFERENCES:
patent: 2005/0069031 (2005-03-01), Sunter et al.
patent: 2005/0243950 (2005-11-01), Laquai et al.
patent: 10-288653 (1998-10-01), None
patent: 2004-93345 (2004-03-01), None
patent: 2004-125552 (2004-04-01), None
Article titled “Jitter Measurements for CLK Generators or Synthesizers”(online), Maxim Integrated Products, Sep. 26, 2003.

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