Measuring device for the measurement of optical properties...

Details Measuring device for the measurement of optical properties... Measuring device for the measurement of optical properties...

2004-11-24

2008-11-11

Pham, Hoa Q (Department: 2886)

Optics: measuring and testing

By monitoring of webs or thread

C356S630000, C204S192130, C204S192260, C204S192290, C204S298030, C427S010000, C118S712000

Reexamination Certificate

active

07450233

ABSTRACT:
A measuring device includes several sequentially disposed coating chambers for measuring optical properties of coated substrates. These coating chambers are separated from one another by partitioning walls, whose free ends are located closely above the substrate. The substrate is preferably a continuous film. By measuring the reflection, the transmission, etc. of the substrate between the individual coating chambers, it becomes possible to carry out measurements within only partially completed layer systems. This yields advantages for the technical operation control of the coating process.

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