Chemistry: electrical and wave energy – Apparatus – Electrolytic
Reexamination Certificate
1998-12-22
2001-03-13
Tung, T. (Department: 1743)
Chemistry: electrical and wave energy
Apparatus
Electrolytic
C422S082010, C324S450000, C204S403060
Reexamination Certificate
active
06200442
ABSTRACT:
FIELD OF THE INVENTION
The invention concerns a measuring device for the electrical measurement of test strips for determining the concentration of substances in a liquid, wherein each test strip has a test field to be wetted with the fluid under investigation, from which test field two electrodes lead to first contact elements on the test strip, the measuring device having a test strip receiver in which are arranged second contact elements for contacting the first contact elements, which second contact elements are connected with a measuring and evaluation circuit of the measuring device.
BACKGROUND OF THE INVENTION
The second contact elements of customary measuring devices are usually formed by spring contact elements arranged in a plug portion. With this there arise high work tool costs for the manufacturing of the contacts and of the plug portion, part costs and assembly costs. Moreover, the spring contact elements are susceptible to wear and damage in the use of the measuring device.
The invention therefore has as its object the provision of a measuring device of the above-mentioned kind in which in simple and economical ways a reliable contact can be made between the contact elements on the test strip and the measuring, and evaluation circuit of the measuring device.
SUMMARY OF THE INVENTION
This object is solved in accordance with the invention in that the second contact elements are formed from contact paths formed on a conductor plate of the measuring device carrying the measuring and evaluation circuit.
In the inventive solution, the previously needed plug portion, including the contact springs, is avoided. On the already previously provided conductor plate, the conductor paths, which previously made the contact to the contract springs of the plug portion, are formed as contact paths. This can take place in the same work procedure as the manufacturing of the conductor plate.
The contact paths guarantee, on one hand, a large surfaced secure contact with the contact elements on the test strip and, on the other hand, they are only slightly susceptible to wear or damage. Above all, they cannot be bent during the insertion of the test strip as was often the case with previous spring contact elements.
The contact paths can pass around the front end of the conductor plate facing the insertion opening of the test strip receiver, so that an early and secure contact between the contact paths on the conductor plate and the contact elements of the test strip can be made. To make the contact effect still more secure, contact points forming raised bumps on the contact paths can be provided. For the same reason, the section of the conductor plate carrying the contact paths can be relieved to form spring arms. The elasticity of the conductor plate material can also be so chosen so that the contact paths are pressed against the contact elements of the test strip with a given pressure.
Another possibility for making a secure contact between the contact elements of the test strip and the contact paths of the conductor plate exists in that the test strip receiver opposite to the contact path carrying conductor plate is provided with a pressure piece for pressing the test strip onto the contact paths. This pressure piece can be loosely inserted in the measuring device so that it can be removed for cleaning of the test strip receiver. In order that the pressure piece is securely held in the measuring device, it can be made snappable into the measuring device.
The pressure piece can also be so formed that, because of an inherent elasticity, it creates the pressing pressure. However, at least one spring element can also be provided to bias the pressure piece in the direction toward the conductor plate.
Preferably, the pressure piece has guide elements for the test strip, and an abutment can also be provided on the pressure piece for limiting the insertion path of the test strip in the insertion direction.
In a plate shaped formation of the pressure piece, it advantageously has a projection for engagement with the test strip in order to achieve secure pressing of the test strip against the contact paths of the conductor plate.
By means of the pressure piece, the test strip in the test strip receiver is held by a clamping effect, and preferably the pressure piece is shiftable out of the pressing position in order to free the test strip. It is then, for example, sufficient to shift the pressure piece and to let the test strip fall out of the test strip receiver without the test strip having to be touched again.
On the conductor plate near the contact paths, but outside of the insertion path of the test strip, a third contact element connected with the measuring and evaluation circuit can further be provided on the conductor plate, which third contact element is intended to make a data connection to a data processing device, such as, for example, a personal computer, for example, over a conducting element insertable into the test strip receiver, with the help of which data processing device the measured results can be read out of the measuring device and processed.
Since the test strips frequently are dipped into the liquid to be investigated and thereby deploy a relatively large amount of moisture, it is advantageous if the test strip receiver is sealed by a fluid tight cover from the remainder of the measuring device.
Further features and advantages of the invention will be apparent from the following description which in connection with the accompanying drawings explain the invention by way of an exemplary embodiment.
REFERENCES:
patent: 5821399 (1998-10-01), Zelin
LRE Technology Partner GmbH
McCormick Paulding & Huber LLP
Tung T.
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