Measuring device for measuring the amount of change in thickness

Details Measuring device for measuring the amount of change in thickness Measuring device for measuring the amount of change in thickness

1981-12-01

1984-04-17

Sikes, William L.

Optics: measuring and testing

By dispersed light spectroscopy

Utilizing a spectrometer

73150R, G01B 902

Patent

active

044431066

ABSTRACT:
A measuring device for measuring the change in time-dependent thickness of the paint layer without any need of direct contact thereto. The device is provided with an optical arrangement which is well-known as Michelson-interferometer in principle, and is effective to obtain sharp and clear interference fringes even though the paint layer has a low reflectivity. It is also possible at laboratory side to observe the change of the paint layer under the circumstances to which the paint layer may be exposed actually.

REFERENCES:
patent: 2338129 (1944-01-01), Moore
patent: 3974678 (1976-08-01), Rooney et al.
Puryayev et al., "An Interferometer for Monitoring Layer Thickness . . . " Sov. J. Optical Tech., vol. 40, No. 3, pp. 162-164, Mar. 1973.

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