Measuring device for measuring one or more properties, such as t

Measuring and testing – Specimen stress or strain – or testing by stress or strain... – By loading of specimen

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Details

73855, G01N 308

Patent

active

058179470

DESCRIPTION:

BRIEF SUMMARY
TECHNICAL FIELD

The present invention relates to a measuring device for measuring the properties of a thin object, especially a fabric, said properties being such as thickness and tension profile across the entire width of the object. The thin object could also be a felt or a cloth. In the present invention it is intended that a thin object is an object having a thickness of up to 20 mm, and especially up to 10 mm.


BACKGROUND ART

It is known that the quality of the finished paper product in paper manufacturing to a large extent is dependent upon the fabric. Therefore it is very important for the paper manufacturer to get knowledge about the fabrics prevailing condition and properties, such as thickness and tension profile, permeability etc. To measure those properties in a reliable way is very difficult today, single there is a lack of measuring apparatuses and methods being capable of mapping the properties across the entire width of the fabric. It is primarily the width of the fabric, up to 10 meters and greater, that makes it difficult to carry out these measurements.
Today the thickness of the fabric is measured with a dial indicator. The problem with this method is that only a few individual points across the edges of the fabric are reachable. Thus, it is difficult to get a picture about the entire thickness profile of the fabric. However, the main problem is that it is difficult to obtain an accurate indication of the position across the width of the fabric for the point being measured for this manual measurement of thickness using the dial indicator. Thereby also the problem to make new comparative measurements at a later point of time arises.
The problems described above in conjunction with the measurement of the thickness also apply to the measurement of the tension profile, permeability etc. of the fabric, even if it has been possible to measure those across the entire fabric. Thus, there is a need to being able to repeatedly carry out measurements across the entire width of the fabric in a simple and reliable way.
EP-0 279 173 discloses a device for measuring changes in the surface profile of strip shaped materials, in an unrolled position, especially photographic base paper. The measuring device is provided inside a carriage like, wheel equipped stand. The transducer of the measuring device is resiliently provided at the bottom of the carriage-like stand to measure changes in the surface profile of the photographic base paper. The carriage-like stand is rolled over the photographic base paper during the measuring process. Thus, the device according to EP-0 279 173 measures the object to be measured from only one side, i.e. only the surface profile and not the thickness profile. Furthermore this device is designed for single measurements, i.e. the purpose is to approve or disapprove the quality of the object being measured and thus the position of the measuring point is not established.
DE-3 507 651 discloses a measuring device for measuring the thickness of extended, extruded plastic objects. In one embodiment the illustrated device measures the thickness of a foil. By means of permanent magnets, that are provided on a support rail on which the foil rests, the thickness of the foil is measured by a measuring head which slides over the foil detecting changes in the magnetic field. The measuring head is brought over the measured object across a rail. If this is done manually or automatically cannot be concluded from the description. This device measures the thickness of the object to be measured, since the measuring device is provided on both sides of the object, but measuring with this device is very time consuming, since permanent magnets first must be arranged on one side of the object to be measured. Furthermore, this device does not have any means to register at which position the measurement is carried out. Therefore this device is not suitable for repeatable, comparative measurements.


OBJECT OF THE INVENTION

The object of the present invention is to provide a measuring device which

REFERENCES:
patent: 2051636 (1936-08-01), Gastrich
patent: 3870629 (1975-03-01), Carter et al.
patent: 4821565 (1989-04-01), Vossbeck et al.
patent: 5373723 (1994-12-01), Chou
4 photos of apparatus installed at Fennofelt, Finland, 1990, 2 pages.
List of installations in Finland, India and USA, 1990, 1 page.
Description of apparatus of D1 and D2, 1990, 11 pages.
Short description of apparatus of D1 and D2, 1990, 6 pages.
Detailed photograph of apparatus of D1 and D2, 1990, 1 page.
Brochure on apparatus of D1, 1990, 4 pages.
Part of a brochure showing the apparatus of D7 (German reference listed above), 1987-1990, 8 pages .
Copy of photo of a further installation of apparatus of D7, 1992, 2 pages.

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