Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1989-01-17
1990-05-08
Rosenberger, Richard A.
Optics: measuring and testing
By polarized light examination
With light attenuation
250561, 356152, G01S 170, G05D 314
Patent
active
049233033
ABSTRACT:
A measuring device for the location and attitude determination of an object, for example, of a space craft for the purpose of docking. At the object several light sources are located, each intensity-modulated with a different code frequency. Optics of the measuring device reproduce the object on a position-sensitive detector. On the basis of its output signals, the image coordinates of the light sources are computed by way of an evaluating device using a frequency multiplexing process.
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patent: 3746452 (1973-07-01), Teboul et al.
patent: 3900260 (1975-08-01), Wendt
patent: 4529315 (1985-07-01), Cohen et al.
patent: 4576481 (1986-03-01), Hansen
patent: 4582424 (1986-04-01), Kawabata
Messerschmitt-Bolkow-Blohm GmbH
Rosenberger Richard A.
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