Measuring device error monitoring system

Electrical transmission or interconnection systems – Nonlinear reactor systems – Parametrons

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

307479, 307262, 356374, 250237G, 33125A, H03K 100, G01B 1114

Patent

active

046789480

ABSTRACT:
A system for error monitoring in a photoelectric incremental length measuring device for the measurement of the relative position of two objects is described. The measuring device generates at least one measuring signal obtained during the scanning of a scale by means of a scanning unit. This signal is fed simultaneously to an evaluating unit and to an error monitoring unit. In the event of faulty signal parameters of the measuring signal, the error monitoring unit generates an error signal. The measuring signal is applied to an inverter and to a first AND gate. The output of the inverter is applied to a second AND gate. The two AND gates also receive the error signal as a second input. This error signal brings about an in-phase switching of the output signals of the two AND gates. The in-phase state of the signals generated by the AND gates is detected by a phase discriminator of an external evaluating unit, which generates an error signal on a respective line.

REFERENCES:
patent: 3849671 (1974-11-01), Molack
patent: 3902126 (1975-08-01), Sassler

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Measuring device error monitoring system does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Measuring device error monitoring system, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Measuring device error monitoring system will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1664431

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.