Measuring device

Details Measuring device Measuring device

2005-12-13

2005-12-13

Pham, Hoa Q. (Department: 2877)

Optics: measuring and testing

Dimension

Thickness

Reexamination Certificate

active

06975410

ABSTRACT:
A method is provided for measuring the wall thickness of transparent articles using non-collimated and diverging light in the form of a small point source or elongated narrow line of light, measuring the spacial separation of the reflections from the nearest and furthest surface by means of a two-dimensional image sensor and a computational device to calculate the geometrical corrections needed to provide accurate thickness measurements. In situations where smooth thickness variations occur, a symmetrical two view embodiment using two non-collimated and diverging light sources and two image sensors at equal but opposite angles of incidence from the same side of the object provides a means to correct for errors caused by internal prism effects as a result of undulations of either the nearest or furthest surface.

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