Measuring deposit thickness in composite materials production

Details Measuring deposit thickness in composite materials production Measuring deposit thickness in composite materials production

1995-11-02

1998-12-01

Russel, Jeffrey E.

Coating apparatus

With means to apply electrical and/or radiant energy to work...

With electromagnetic and/or electrostatic removal of...

118723R, 118730, C23C 400, G01B 1106

Patent

active

058432329

ABSTRACT:
This invention relates to novel apparatuses for measuring deposit thickness during composite materials production. More particularly, this invention uses a composite's emission signature or a composite's reflectance signature, to measure deposit thickness.

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patent: 5387309 (1995-02-01), Bobel et al.
patent: 5460774 (1995-10-01), Bachlet et al.
patent: 5551983 (1996-09-01), Shepard, Jr. et al.

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