Measuring current on a die

Details Measuring current on a die Measuring current on a die

2005-04-12

2005-04-12

Karlsen, Ernest (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S1540PB, C702S064000

Reexamination Certificate

active

06879178

ABSTRACT:
Disclosed are various systems, methods, and programs embodied in computer readable mediums for measuring current in a central processor unit (CPU) package. To measure the current, a voltage V(t) is determined in situ across at a power input of a die in the CPU package while running a computer process on the die. Then, the Fourier transform of the voltage Ff(V(t)) is calculated from the voltage V(t). The current at the power input of the die in the frequency domain (Ff(Idd(t))) can then be calculated from the voltage Ff(V(t)) and impedance Zf, where the impedance Zfcomprises an impedance of a power supply loop coupled to the power input as a function of frequency. Finally, the current Idd(t) at the power input of the die is determined in the time domain by calculating the inverse Fourier transform of the current in the frequency domain Ff(Idd(t)).

REFERENCES:
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patent: 6337571 (2002-01-01), Maddala et al.
patent: 6518782 (2003-02-01), Turner

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