Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2005-04-12
2005-04-12
Karlsen, Ernest (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S1540PB, C702S064000
Reexamination Certificate
active
06879178
ABSTRACT:
Disclosed are various systems, methods, and programs embodied in computer readable mediums for measuring current in a central processor unit (CPU) package. To measure the current, a voltage V(t) is determined in situ across at a power input of a die in the CPU package while running a computer process on the die. Then, the Fourier transform of the voltage Ff(V(t)) is calculated from the voltage V(t). The current at the power input of the die in the frequency domain (Ff(Idd(t))) can then be calculated from the voltage Ff(V(t)) and impedance Zf, where the impedance Zfcomprises an impedance of a power supply loop coupled to the power input as a function of frequency. Finally, the current Idd(t) at the power input of the die is determined in the time domain by calculating the inverse Fourier transform of the current in the frequency domain Ff(Idd(t)).
REFERENCES:
patent: 4630228 (1986-12-01), Tarczy-Hornoch et al.
patent: 5461329 (1995-10-01), Linehan et al.
patent: 5483170 (1996-01-01), Beasley et al.
patent: 5963038 (1999-10-01), De Jong et al.
patent: 6002264 (1999-12-01), Gilbert et al.
patent: 6239587 (2001-05-01), Buck
patent: 6337571 (2002-01-01), Maddala et al.
patent: 6518782 (2003-02-01), Turner
Houghton Christopher Lee
Kantorovich Isaac
St. Laurent James J.
LandOfFree
Measuring current on a die does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Measuring current on a die, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Measuring current on a die will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3370276