Thermal measuring and testing – Determination of inherent thermal property – Thermal conductivity
Patent
1988-04-04
1990-02-20
Yasich, Daniel M.
Thermal measuring and testing
Determination of inherent thermal property
Thermal conductivity
73 27R, 7320425, 338 22R, G01N 3100, G01N 2518
Patent
active
049021389
ABSTRACT:
The thermal conductivity in a gas blend is measured in order to determine concentration using several different temperatures for the gas but the same sensor, which includes a Silicon carrier of a few hundred micrometers thick and being provided with an electrically insulating layer; carrying a sputtered on or vapor deposited, meandershaped thin film resistance; a pit in the carrier underneath the resistance and the insulating layer, there being one or more perforations in the insulation to permit access of gas to the interior of the pit; a cover plate made also of silicon and of comparable thickness dimensions as the carrier, and also having a pit of comparable dimensions as the first mentioned pit is disposed above the carrier so that said pits are aligned and constitute a common measuring chamber; and a diffusion channel in the cover plate for feeding a gas through diffusion so that the measuring chamber is defined by the communicating pits.
REFERENCES:
patent: 3444739 (1969-05-01), Treharne
patent: 3607084 (1971-09-01), MacKey et al.
patent: 3616677 (1971-11-01), Oppegaard
patent: 4389876 (1983-06-01), Szonntagh
patent: 4594879 (1986-06-01), Maeda et al.
Goeldner Heinz-Dieter
Horn Bertold
Liedtke Thomas
Marx Wolf-Ruediger
Schaefer Werner
Hartmann & Braun AG
Siegemund Ralf H.
Yasich Daniel M.
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