Measuring circuit of the additive phase noise characteristic of

Details Measuring circuit of the additive phase noise characteristic of Measuring circuit of the additive phase noise characteristic of

1990-05-21

1991-10-01

Wieder, Kenneth A.

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Parameter related to the reproduction or fidelity of a...

324 77G, 324 83R, 324 83A, 324614, 36472803, G01R 2700

Patent

active

050537148

ABSTRACT:
A measuring circuit for the additive phase noise characteristic of a component in the vicinity of a carrier frequency. The measuring circuit is constructed of a central channel and two side channels. Each of these channels contains a model of the component to be characterized. Two phase detecting circuits are employed in which each processes an input signal from one of the side channels with an input signal from the central channel to generate signals which represent phase deviations between the two input signals. An intercorrelation circuit then utilizes the outputs from these phase detecting circuits to determine the characteristic additive phase noise of the component to be characterized by eliminating any additive phase noise superadded by other measuring circuit elements or induced by outside disturbances.

REFERENCES:
patent: 3961172 (1976-06-01), Mutcheon
patent: 4118665 (1978-10-01), Reinhardt
patent: 4581767 (1986-04-01), Monsen
Proceedings of the 41st Annual Frequency Symposium 1987, IEEE Catalog No. 87 CH2427-3, Library of Congress No. 58-60781, Dunfey City Line Hotel, Philadelphia, Pennsylvania, U.S., pp. 507-511; D. E. Philips: "Random noise in digital gates and dividers" *FIG. 5*.
I.S.A. Transactions, vol. 21, 1982, No. 4, pp. 37-44; A. L. Lance et al: "Phase noise measurement systems" *FIGS. 2,4,6*.
IEEE Transactions on Macrowave Theory and Techniques, vol. MTT-16, No. 9, Sep. 1968, pp. 761-766; K. H. Sann: "The measurement of near-carrier noise in microwave amplifiers" *FIGS. 1,3*.

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