Measuring chip

Details Measuring chip Measuring chip

2006-03-07

2006-03-07

Toatley, Jr., Gregory J. (Department: 2877)

Optics: measuring and testing

Of light reflection

Reexamination Certificate

active

07009706

ABSTRACT:
A measuring chip comprising a dielectric block and a thin film layer formed on one surface of the dielectric block. The thin film layer is used for placing a sample thereon. The dielectric block is formed as a single block, which includes an entrance surface at which a light beam enters the dielectric block, an exit surface from which the light beam emerges, and the one surface on which the thin film layer is formed. In addition, the dielectric block is integrated with the thin film layer and formed from a resin whose photoelastic coefficient is less than 50×10−12Pa−1.

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