Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2006-08-01
2006-08-01
Deb, Anjan (Department: 2858)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
C324S071500
Reexamination Certificate
active
07084641
ABSTRACT:
A measuring cell for recording an electrical potential of an analyte situated on the measuring cell. The measuring cell has a sensor, a layer arranged above the sensor and electrically insulating the analyte from the sensor, and an amplifier circuit connected to the sensor on a substrate and having an input stage containing a field-effect transistor or a bipolar transistor, the sensor being at least indirectly connected to a control terminal of the field-effect transistor or of the bipolar transistor. An operating point of the amplifier circuit is set by means of a voltage or a current applied at the control terminal of the field-effect transistor or of the bipolar transistor of the input stage of the amplifier circuit.
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Brederlow Ralf
Eversmann Bjorn-Oliver
Koren Ivo
Paulus Christian
Thewes Roland
Deb Anjan
Dickstein , Shapiro, Morin & Oshinsky, LLP
Infineon - Technologies AG
Nguyen Hoai-An D.
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