Measuring apparatus, testing apparatus, and electronic device

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system

Reexamination Certificate

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Details

C702S066000, C702S069000, C702S082000, C324S532000, C324S701000, C324S1540PB

Reexamination Certificate

active

07856330

ABSTRACT:
A measuring apparatus measures a signal-under-test having a signal level that changes at predetermined bit time intervals. A strobe timing generator sequentially generates strobes at even time intervals. A level comparator detects a level of the signal at a timing at which each strobe is sequentially provided. A capture memory stores a signal level output from the comparator. A signal processor calculates a measurement of the signal based on a data series including data taken at even time intervals, each larger than a bit time interval of the signal.

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