Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2008-07-08
2008-07-08
Barlow, John E (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C702S066000, C702S071000, C702S082000, C324S12100R, C324S1540PB, C324S532000, C324S763010
Reexamination Certificate
active
07398169
ABSTRACT:
There is provided a measuring apparatus for measuring a signal-under-test, having a comparator for sequentially comparing voltage values of the signal-under-test with a reference voltage value fed thereto at timing of strobe signals sequentially fed thereto, a strobe timing generator for sequentially generating the strobe signals placed almost at equal time intervals, a capture memory for storing the comparison result of the comparator and a digital signal processing section for calculating jitter of the signal-under-test based on the comparison result stored in the capture memory.
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Jitter Measurements for CLK Generators or Synthesizers, Maxim Integrated Products, Sep. 26, 2003, pp. 1-4.
Ishida Masahiro
Iwamoto Satoshi
Suda Masakatsu
Yamaguchi Takahiro
Advantest Corporation
Barlow John E
Sterne Kessler Goldstein & Fox P.L.L.C.
Vo Hien X
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