Measuring apparatus for X-ray fluorescence analysis

Details Measuring apparatus for X-ray fluorescence analysis Measuring apparatus for X-ray fluorescence analysis

1980-03-24

1984-01-17

Church, Craig E.

X-ray or gamma ray systems or devices

Specific application

Fluorescence

378 70, 378145, G01N 2322

Patent

active

044267177

ABSTRACT:
A measuring apparatus for X-ray fluorescence analysis in which the specimen s stimulated by glancing incident radiation and is examined spectrometrically by a detector disposed above the specimen. In the path of rays of the stimulating X-radiation there is disposed a reflector which in operation deflects the X-radiation to the surface of the specimen.

REFERENCES:
patent: 3944822 (1976-03-01), Dyubay

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