Measuring apparatus for degree of spin polarization of an electr

Details Measuring apparatus for degree of spin polarization of an electr Measuring apparatus for degree of spin polarization of an electr

1977-10-13

1979-05-08

Anderson, Bruce C.

Radiant energy

Irradiation of objects or material

Irradiation of semiconductor devices

324 71E, G21K 110

Patent

active

041538447

ABSTRACT:
An electron beam is monochromatized, brought to an appropriate energy lev by acceleration or slowing down, and focussed on a monocrystal electron scattering surface. Backscattered electrons are measured at complementary scattering angles, but only after slow electrons are separated or trapped that result from inelastic interaction with the crystal. The response of the detectors of a pair, in pulse count or current flow, allows the degree of spin polarization P to be calculated by

REFERENCES:
patent: 2260041 (1941-10-01), Mahl et al.
patent: 3287558 (1966-11-01), Bly et al.
patent: 3445708 (1969-05-01), Webster
patent: 3935454 (1976-01-01), Lee

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