Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Distributive type parameters
Patent
1997-03-07
1998-04-28
Karlsen, Ernest F.
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Distributive type parameters
324642, 324632, 324633, G01R 2704
Patent
active
057449708
ABSTRACT:
A measuring apparatus and method of a permittivity of a dielectric material employs a cavity and a variable reactance connected to the outside the cavity to measure the permittivity of the dielectric material, in which a power-feeding post is installed within the cavity, the variable reactance for forcibly resonating the cavity is attached to the upper portion of the cavity at the end of the power-feeding post, a network analyzer is connected to the power-feeding post, and the dielectric material specimen to be measured fills up the cavity, so that the length of the variable reactance is adjusted to forcibly resonate the cavity and, at this time, the length of the variable reactance is measured to determine the permittivity of the dielectric material. Thus, unknown permittivity is simply measured while enabling the broadband measurement. A small cavity at a cut-off state is employed to be suitable for measuring the permittivity in a low frequency band.
REFERENCES:
patent: 3889182 (1975-06-01), Easley
patent: 3953796 (1976-04-01), Keller
patent: 4277741 (1981-07-01), Faxvog
patent: 5157337 (1992-10-01), Neel et al.
patent: 5187443 (1993-02-01), Bereskin
Zaltsman: "Perfected Method of Measuring Dielectric Permitivity . . . "--Meas. Tech. (USA)--vol. 20--(Jul. 1977)--(pp. 1072-1075).
McPhun et al. Mar. 1972 Simple Resonator Method for Measuring Dispersion of Microstrip.
Sproull et al. May 1946 Rosonant Cavity Measurements.
Benadda et al. Jan. 1982 A measuring device for the determination of the electric permittivity of materials in the frequency range 0.1-300 Hz.
Mehmet et al. Jul. 1970 Microwave Measurement of Thin Film Dielectric Properties.
Works et al Mar. 1947 Resonant Cavities for Dielectric Measurements.
Buzin et al. Dec. 1974 Dynamic method of measuring Q of Dielectric Resonators.
Pointon et al. Mar. 1971 A coaxial cavity for measuring the dielectric properties of high permittivity materials.
Kim Ki Chai
Ro Se Yong
Karlsen Ernest F.
LG Electronics Inc.
Solis Jose M.
White John P.
LandOfFree
Measuring apparatus and method of a permittivity of a dielectric does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Measuring apparatus and method of a permittivity of a dielectric, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Measuring apparatus and method of a permittivity of a dielectric will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1535754