Measuring apparatus, and detection device

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Distributive type parameters

Reexamination Certificate

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C324S646000

Reexamination Certificate

active

07622932

ABSTRACT:
A measuring apparatus that measures a characteristic of a device under measurement is provided. The measuring apparatus includes: a signal generating section that outputs a forward signal to the device under measurement through a device side terminal; a directional coupler that outputs a backward split signal obtained by splitting a part of a backward signal inputted from the device under measurement through the device side terminal; a backward mixer that outputs a backward detection signal obtained by multiplying a local signal having a predetermined frequency by the backward split signal; and an analysis section that analyzes a characteristic of the device under measurement based on the backward detection signal. The directional coupler is included in a multilayer substrate, and the backward mixer is included in a chip provided on a surface of the multilayer substrate.

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patent: 6636816 (2003-10-01), Dvorak et al.
patent: 7218186 (2007-05-01), Chen
patent: 06-232608 (1994-08-01), None
patent: 08-078917 (1996-03-01), None
patent: 08-167818 (1996-06-01), None
patent: 10-311854 (1998-11-01), None
patent: 2001-285112 (2001-10-01), None
patent: 2004-132985 (2004-04-01), None

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